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SN74BCT8244ADWE4 datasheet

SN74BCT8244ADWE4 manufactured by:
Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70

Others with the same file for datasheet:
SN74BCT8244A 		Download SN74BCT8244ADWE4 datasheet from
Texas Instruments		 PDF
 388 kb 
SN74BCT8244ADW View SN74BCT8244ADWE4 to our catalog SN74BCT8244ADWR




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