| 1423681 | SCAN90CP02VY | 1.5 Gbps 2x2 LVDS Crosspoint Switch with Pre-Emphasis and IEEE 1149.6 | National Semiconductor |
| 1423682 | SCAN90CP02VY/NOPB | 1.5 Gbps 2x2 LVDS Crosspoint Switch with Pre-Emphasis and IEEE 1149.6 32-LQFP -40 to 85 | Texas Instruments |
| 1423683 | SCAN90CP02VYX | 1.5 Gbps 2x2 LVDS Crosspoint Switch with Pre-Emphasis and IEEE 1149.6 | National Semiconductor |
| 1423684 | SCAN921023 | 20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST | National Semiconductor |
| 1423685 | SCAN921023 | 20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access | Texas Instruments |
| 1423686 | SCAN921023SLC | 20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access | National Semiconductor |
| 1423687 | SCAN921023SLC | 20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 | Texas Instruments |
| 1423688 | SCAN921023SLC/NOPB | 20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 | Texas Instruments |
| 1423689 | SCAN921023SLCX | 20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access | National Semiconductor |
| 1423690 | SCAN921025 | 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST | National Semiconductor |
| 1423691 | SCAN921025 | 30-80 MHz 10 Bit Bus LVDS Serializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA | Texas Instruments |
| 1423692 | SCAN921025H | High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access | National Semiconductor |
| 1423693 | SCAN921025H | High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access | Texas Instruments |
| 1423694 | SCAN921025HSM | High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access | National Semiconductor |
| 1423695 | SCAN921025HSM | High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 | Texas Instruments |
| 1423696 | SCAN921025HSM/NOPB | High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 | Texas Instruments |
| 1423697 | SCAN921025HSMX | High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access | National Semiconductor |
| 1423698 | SCAN921025HSMX/NOPB | High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 | Texas Instruments |
| 1423699 | SCAN921025SLC | 30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access | National Semiconductor |
|
| 1423700 | SCAN921025SLC/NOPB | 30-80 MHz 10 Bit Bus LVDS Serializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA | Texas Instruments |
| 1423701 | SCAN921025SLCX | 30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access | National Semiconductor |
| 1423702 | SCAN921224 | 20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST | National Semiconductor |
| 1423703 | SCAN921224 | 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access | Texas Instruments |
| 1423704 | SCAN921224SLC | 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access | National Semiconductor |
| 1423705 | SCAN921224SLC | 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 | Texas Instruments |
| 1423706 | SCAN921224SLC/NOPB | 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 | Texas Instruments |
| 1423707 | SCAN921224SLCX | 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access | National Semiconductor |
| 1423708 | SCAN921226 | 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST | National Semiconductor |
| 1423709 | SCAN921226 | 30-80 MHz 10 Bit Bus LVDS Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA | Texas Instruments |
| 1423710 | SCAN921226H | High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access | National Semiconductor |
| 1423711 | SCAN921226H | High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access | Texas Instruments |
| 1423712 | SCAN921226HSM | High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access | National Semiconductor |
| 1423713 | SCAN921226HSM | High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 | Texas Instruments |
| 1423714 | SCAN921226HSM/NOPB | High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 | Texas Instruments |
| 1423715 | SCAN921226HSMX | High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access | National Semiconductor |
| 1423716 | SCAN921226SLC | 30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access | National Semiconductor |
| 1423717 | SCAN921226SLC/NOPB | 30-80 MHz 10 Bit Bus LVDS Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA | Texas Instruments |
| 1423718 | SCAN921226SLCX | 30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access | National Semiconductor |
| 1423719 | SCAN921260 | X6 1:10 Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST | National Semiconductor |
| 1423720 | SCAN921260 | six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST | Texas Instruments |
